The FRA 106/S can be attached to several of Bruker Optics' FT-IR and FT-NIR spectrometers;

• VERTEX 70
• EQUINOX 55
• IFS 66 Series

providing a cost-effective FT-IR/FT-Raman solution without sacrificing performance and sampling flexibility for either type of measurement. The components used in the FRA 106/S are identical to those in our RFS 100/S FT-Raman spectrometer, including an optional high-sensitivity Ge detector. The sensitivity of the Ge detector is up to 10 times higher than a room-temperature detector and can make or break the analysis of difficult samples.

Our flexible FT-IR and FT-NIR product line enables us to customize a system according to individual needs. For example, a broadband KBr beamsplitter can be used for mid-IR, near-IR and FT-Raman measurements with less than 20% signal loss in the Raman experiment. For applications where sensitivity is critical, a CaF₂ beamsplitter and cooled Ge detector are required. Finally, for FT-IR systems which require measurement at shorter wavelengths (i.e. visible), an optics bench can be equipped with a quartz beamsplitter.

 

Solid, liquid, and even gaseous samples can easily be measured in RFS 100/S 's large sample compartment by using the variety of sample holders. A wide range of advanced sampling accessories are available for research applications, as well as automatic sample changers of different sizes to optimize sample throughput in industrial laboratories.

Equipped with a broad-range quartz beamsplitter, Bruker Optics' patented frictionless interferometer with its ROCKSOLID™ alignment provides high sensitivity and stability. The diode-pumped, air-cooled Nd:YAG laser source is controlled completely through software. The standard RFS 100/S configuration provides a spectral range of 3600 – 70 cm^-1 (Stokes shift) and –100 – -2000 cm^-1 (anti-Stokes shift). Other standard features include: easy switch between 90^o and 180^o scattering geometry, defocusing optics (necessary for colored samples which can heat in the laser beam), motorized sample stage for optimizing the sample position, and a white light source to correct the spectra for instrument response. The system can be equipped with either or both an InGaAs detector and a proprietary high-sensitivity Ge diode. Other options include a second excitation laser port and two fiber optic coupling ports for the RAMANSCOPE™ and Ramprobe.

All Bruker Optics FT-Raman systems have a large front-mounted sample compartment to provide unlimited access from three sides. Both 90o and 180o scattering geometries are available with the standard sampling optics. Switching between modes is simple and does not require reorientation of the sample. A complete set of sample holders and test samples is provided with each FT-Raman system. The sample compartment can be adapted easily for specialized applications. A variety of sample arms and modified covers are available. In addition, the cover and compartment base can be removed to bring the laser to an external set-up such as a cryostat.

• Fluorescence-free Raman spectra with 1064nm excitation
• Rapid analysis with a minimum of sample preparation
   
• Gold-coated optics for highest throughput
   
• Spectral range: 3600 – 70 cm^-1
• Step scan option for time resolved studies
• Dual laser/detector option
• Wide range of sampling accessories

RFS 100/S related links: FT-Raman microscopy | FT-Raman accessories | Dispersive Raman